{"id":7954,"date":"2022-08-10T09:08:42","date_gmt":"2022-08-10T07:08:42","guid":{"rendered":"https:\/\/wats.com\/?p=7954"},"modified":"2024-07-24T08:35:30","modified_gmt":"2024-07-24T06:35:30","slug":"statistical-process-control-in-electronics-manufacturing","status":"publish","type":"post","link":"https:\/\/wats.com\/statistical-process-control-in-electronics-manufacturing\/","title":{"rendered":"Don’t Be Misled by Statistical Process Control in Electronics Manufacturing"},"content":{"rendered":"[vc_row type=”in_container” full_screen_row_position=”middle” column_margin=”default” column_direction=”default” column_direction_tablet=”default” column_direction_phone=”default” scene_position=”center” text_color=”dark” text_align=”left” row_border_radius=”none” row_border_radius_applies=”bg” overlay_strength=”0.3″ gradient_direction=”left_to_right” shape_divider_position=”bottom” bg_image_animation=”none”][vc_column column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/1″ tablet_width_inherit=”default” tablet_text_alignment=”default” phone_text_alignment=”default” column_border_width=”none” column_border_style=”solid” bg_image_animation=”none”][vc_column_text]Statistical Process Control (SPC) is great for basic products. But for complex electrical manufacturing, it doesn\u2019t cut it and could cost you time and money.\u00a0<\/em>[\/vc_column_text][\/vc_column][\/vc_row][vc_row type=”in_container” full_screen_row_position=”middle” column_margin=”default” column_direction=”default” column_direction_tablet=”default” column_direction_phone=”default” scene_position=”center” bottom_padding=”3%” text_color=”dark” text_align=”left” row_border_radius=”none” row_border_radius_applies=”bg” overlay_strength=”0.3″ gradient_direction=”left_to_right” shape_divider_position=”bottom” bg_image_animation=”none” shape_type=””][vc_column column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/1″ tablet_width_inherit=”default” tablet_text_alignment=”default” phone_text_alignment=”default” column_border_width=”none” column_border_style=”solid” bg_image_animation=”none”][vc_column_text]There is no one-size-fits-all when it comes to creating a test environment. Whatever you create needs to give you the right data. That data is going to give your business insight which it can use to make better decisions \u2013 saving time and money. Focusing on irrelevant, or even incorrect data is a trap that many companies fall into \u2013 but there is a better way.<\/span>[\/vc_column_text][\/vc_column][\/vc_row][vc_row type=”in_container” full_screen_row_position=”middle” column_margin=”default” column_direction=”default” column_direction_tablet=”default” column_direction_phone=”default” scene_position=”center” bottom_padding=”3%” text_color=”dark” text_align=”left” row_border_radius=”none” row_border_radius_applies=”bg” overlay_strength=”0.3″ gradient_direction=”left_to_right” shape_divider_position=”bottom” bg_image_animation=”none” shape_type=””][vc_column column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/1″ tablet_width_inherit=”default” tablet_text_alignment=”default” phone_text_alignment=”default” column_border_width=”none” column_border_style=”solid” bg_image_animation=”none”][vc_column_text]\n

Information Overload<\/h2>\n

SPC<\/a> is still found in continuous manufacturing processes and is used to calculate control limits and find misordered process parameters. But it\u2019s a set of controls that don\u2019t meet the complex demands of modern electrical manufacturing.<\/p>\n

If you\u2019re using statistical process control in order to find problems in electronics manufacturing, then because of the complexity of what you are making and all of the factors that impact it there are going to be trends, alerts, and warnings on every data set that you look at that will cloud what you really need to see.[\/vc_column_text][vc_row_inner column_margin=”default” column_direction=”default” column_direction_tablet=”default” column_direction_phone=”default” text_align=”left”][vc_column_inner column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/2″ tablet_width_inherit=”default” column_border_width=”none” column_border_style=”solid” bg_image_animation=”none”][vc_column_text]Let\u2019s use a simple example, if one of your tests brings back fail and it\u2019s clear that it was a component fault, you swap it out and retest. The problems start when it fails again because so many other factors could be causing the issue. Temperature, humidity, different machine operators, and test equipment calibration all impact electrical manufacturing and testing. It could even be on a software level there have been updates that impact reporting.[\/vc_column_text][\/vc_column_inner][vc_column_inner column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/2″ tablet_width_inherit=”default” column_border_width=”none” column_border_style=”solid” bg_image_animation=”none”][image_with_animation image_url=”7963″ animation=”Fade In” hover_animation=”none” alignment=”center” border_radius=”none” box_shadow=”none” image_loading=”default” max_width=”100%” max_width_mobile=”default”][\/vc_column_inner][\/vc_row_inner][vc_row_inner column_margin=”default” column_direction=”default” column_direction_tablet=”default” column_direction_phone=”default” text_align=”left”][vc_column_inner column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/1″ tablet_width_inherit=”default” column_border_width=”none” column_border_style=”solid” bg_image_animation=”none”][vc_column_text]The point is that you need test data that you can trust and take action on. If you\u2019re told something is wrong incorrectly at every stage of testing, eventually your testers are just going to ignore the notifications they receive \u2013 they\u2019ll be desensitized to them. When you\u2019re producing at scale, it takes too much time to look into each and every issue if they\u2019re reported more often than needed, and this can also cause backlogs in testing.[\/vc_column_text][\/vc_column_inner][\/vc_row_inner][\/vc_column][\/vc_row][vc_row type=”in_container” full_screen_row_position=”middle” column_margin=”default” column_direction=”default” column_direction_tablet=”default” column_direction_phone=”default” scene_position=”center” bottom_padding=”3%” text_color=”dark” text_align=”left” row_border_radius=”none” row_border_radius_applies=”bg” overlay_strength=”0.3″ gradient_direction=”left_to_right” shape_divider_position=”bottom” bg_image_animation=”none” shape_type=””][vc_column column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/1″ tablet_width_inherit=”default” tablet_text_alignment=”default” phone_text_alignment=”default” column_border_width=”none” column_border_style=”solid” bg_image_animation=”none”][vc_column_text]\n

Knowing What\u2019s Important<\/h2>\n

Some manufacturers limit what they investigate to an arbitrary number of key performance indicators (KPIs), such as power output, response time, bandwidth etc. These are key measurements of how well the product is working, but because only a handful of existing tests have been chosen, you\u2019ve thrown away a heap of other information. If you\u2019ve done that to make the number of errors you receive more manageable, you\u2019re potentially ignoring faults elsewhere in the testing process.<\/p>\n

Beyond ignoring data creating too much noise, it also means you can mistake one result for another. Perhaps you have an alert that goes off for one test procedure to advise it\u2019s over the set threshold. You need to answer, \u201cwhy is that happening?\u201d. The problem you have by stripping your results down is that now you can only see results through that one lens.[\/vc_column_text][vc_column_text]What you really need is a test data solution that shows you all the right information at all times \u2013 that\u2019s what WATS is for.<\/p>\n

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[vc_row type=”in_container” full_screen_row_position=”middle” column_margin=”default” column_direction=”default” column_direction_tablet=”default” column_direction_phone=”default” scene_position=”center” text_color=”dark” text_align=”left” row_border_radius=”none” row_border_radius_applies=”bg” overlay_strength=”0.3″ gradient_direction=”left_to_right” shape_divider_position=”bottom” bg_image_animation=”none”][vc_column column_padding=”no-extra-padding” column_padding_tablet=”inherit” column_padding_phone=”inherit” column_padding_position=”all” background_color_opacity=”1″ background_hover_color_opacity=”1″ column_shadow=”none” column_border_radius=”none” column_link_target=”_self” gradient_direction=”left_to_right” overlay_strength=”0.3″ width=”1\/1″ tablet_width_inherit=”default” tablet_text_alignment=”default”…<\/p>\n","protected":false},"author":3,"featured_media":7961,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"content-type":"","footnotes":""},"categories":[6],"tags":[3113],"class_list":{"0":"post-7954","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","7":"category-blog","8":"tag-statistical-process-control"},"yoast_head":"\nIn-house testing solutions aren\u2019t the way to go.<\/title>\n<meta name=\"description\" content=\"Statistical Process Control (SPC) is great for basic products. SPC is still found in continuous manufacturing processes and is used to calculate control limits and find misordered process parameters.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/wats.com\/statistical-process-control-in-electronics-manufacturing\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Don't Be Misled by Statistical Process Control in Electronics Manufacturing\" \/>\n<meta property=\"og:description\" content=\"Statistical Process Control (SPC) is great for basic products. 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